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DF-749 / H2O / 1 PPB

 

DF-749 NanoTrace

Tunable Diode Laser (TDL) sensor trace/ultra-trace moisture measurements for checks of ultra high purity electronic gases

Gas
Measures


Applications
Sensing Technology

 

The DF-749 provides trace and ultra-trace moisture contaminant measurements in various background gases including nitrogen, hydrogen, helium, argon and oxygen. Ideal for quality checking of UHP gases used in LCD and LED manufacture, the DF-749’s compact form makes it easily portable for easy cart or mobile use. A robust hardware/software design virtually eliminates dry down times often associated with UHP gas checking.

Offering an ultra-sensitive Lower Detection Limit (LDL) of 250ppt, this device uses industry-leading Tunable Diode Laser (TDL) sensing technology, delivering ultra-reliable baseline measurements and a fast speed of response. This analyzer is also highly affordable over product life, with a robust sensor construction that has low lifetime maintenance requirements and a zero-drift measurement stability that greatly extends calibration intervals. Factory pre-calibration also provides simplified set up. 

 

 

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